Gianfranco Pacchioni,Linards Skuja,David L. Griscom: Defects in SiO2 and Related Dielectrics: Science and Technology
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Author: Gianfranco Pacchioni,Linards Skuja,David L. Griscom
Number of Pages: 624 pages
Published Date: 01 Feb 2001
Publisher: Springer
Publication Country: Dordrecht, Netherlands
Language: English
ISBN: 9780792366867
Download Link: Click Here
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